SPEC NO: DSAI6846 REV NO: V.8B DATE: APR/13/2011
PAGE: 10 OF 10
APPROVED: WYNEC CHECKED: Allen Liu DRAWN: C.H.HAN ERP: 1212000461
3.2X2.8mm SMD LED WITH CERAMIC SUBSTRATE
Reliability Test Items And Conditions
The reliability of products shall be satisfied with items listed below
Lot Tolerance Percent Defective (LTPD) : 10%
No.
Test Item
Standards
Test Condition
Test Times / Number of
Cycles
Damaged
1
Continuous operating test
-
Ta =25°C +10/-5°C ,RH=55+/-20%RH 1,000 h
IF = maximum rated current*
0 / 22
2
High Temp. operating test
-
Ta = 100°C(+/-10°C) 1,000 h
IF = maximum rated current*
0 / 22
3
Low Temp. operating test
-
Ta = -40°C+3/-5°C 1,000 h
IF = maximum rated current*
0 / 22
4
High temp. storage test
JEITA ED-
4701/200 201
Ta = maximum rated storage temperature
Ta = 100°C(+/-10°C) 1,000 h
0 / 22
5
Low temp. storage test
JEITA ED-
4701/200 202
Ta = -40°C+3/-5°C
1,000 h
0 / 22
6
High temp. & humidity storage test
JEITA ED-
4701/100 103
Ta = 60°C+5/-3°C, RH = 90+5/-10%RH
1,000 h
0 / 22
7
High temp. & humidity operating
test
-
Ta = 60°C+5/-3°C, RH = 90%+5/-10%RH
IF = maximum rated current*
500h
0 / 22
8
Resistance to Soldering Heat JEITA ED-
(Reflow Soldering)
4701/300 301
Tsld=260°C,10sec
2 times
0 / 22
9
Solderability JEITA ED-
(Reflow Soldering)
4701/300 303
Tsld=245°C+/-5°C,5+/-1sec
1 time over 0 / 22
95%
11
Temperature Cycle
JEITA ED-
4701/100 105
-40°C(30min) ~25°C(5min)~-100°C
(30min) ~25°C(5min)
100cycles
0 / 22
12
Thermal shock test
MIL-STD-
202G
Ta = -40°C(15min) ~100°C(15min)
500 cycles
0 / 22
13
Electric Static Discharge (ESD)
JEITA ED-
4701/300 304
C = 100pF , R= 1.5K?
V = 250V
3 times
Negative/
Positive
0 / 22
* : Refer to forward current vs. derating curve diagram.
14
Vibration test
JEITA ED-
4701/400 403
100~2000~100HZ Sweep 4min.
200m/s2 48min.
0 / 22
3directions,4cycles
10
Temperature Cycle operating test
-
-40°C(30min) ~25°C(5min)~-100°C
(30min) ~25°C(5min)
IF = derated current at 100°C
10cycles
0 / 22
Symbol
Test Conditions
Criteria
for
Judgement
Min.
Max.
Forward Voltage
VF
IF = 350mA
-
Initial Level x 1.1
Luminous Flux
Φv
IF = 350mA
Initial Level x 0.7
-
Item
Criteria
For
Judging
Damage
* : The test is performed after the board is cooled down to the room temperature.
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